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Probing defects in ZnO by persistent phosphorescence

Honggang Ye, Zhicheng Su, Fei Tang, et al

Native point defects in ZnO are so complicated that most of them are still debating issues, although they have been studied for decades. In this paper, we experimentally reveal two sub-com...

First published at: Jul 24, 2018

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doi:10.29026/oea.2018.180011

Opto-Electronic Advances, Vol. 01, Issue 06, pp. 180011

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