Dou K H, Xie X, Pu M B, Li X, Ma X L et al. Off-axis multi-wavelength dispersion controlling metalens for multi-color imaging. Opto-Electron Adv 3, 190005 (2020). doi: 10.29026/oea.2020.190005
Citation: Dou K H, Xie X, Pu M B, Li X, Ma X L et al. Off-axis multi-wavelength dispersion controlling metalens for multi-color imaging. Opto-Electron Adv 3, 190005 (2020). doi: 10.29026/oea.2020.190005

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Off-axis multi-wavelength dispersion controlling metalens for multi-color imaging

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  • These authors contributed equally to this work.

  • *Corresponding author: X G Luo, E-mail: lxg@ioe.ac.cn
  • Dispersion control is crucial in optical systems, and chromatic aberration is an important factor affecting imaging quality in imaging systems. Due to the inherent property of materials, dispersion engineering is complex and needs to trade off other aberration in traditional ways. Although metasurface offers an effective method to overcome these limits and results in well-engineered dispersion, off-axis dispersion control is still a challenging topic. In this paper, we design a single-layer metalens which is capable of focusing at three wavelengths (473 nm, 532 nm, and 632 nm) with different incident angles (0°, -17° and 17°) into the same point. We also demonstrate that this metalens can provide an alternative for the bulky color synthetic prism in a 3-chips digital micromirror device (DMD) laser projection system. Through this approach, various off-axis dispersion controlling optical devices could be realized.
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