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High-quality 3D shape measurement based on ant colony phase jitter optimization
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Abstract
Defocus dithering technology effectively avoids the non-linear effects introduced by commercial projectors and can achieve high-speed dynamic measurement. However, the binary dithering stripes after defocusing and the standard sinusoidal stripes are not completely close, and there will be a certain deviation in the measurement process. Aiming at the measurement error, this paper proposes an optimization method based on an improved binary ant colony algorithm, which optimizes and improves the binary defocus dithering technology from the phase domain to better improve the measurement accuracy. Through the optimization of small-size binary blocks, the entire optimization process is replaced, and the optimization efficiency is improved. Simulation and experimental results prove that this method can achieve effective three-dimensional measurement under different defocus conditions. -
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References
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Overview
Overview: The digital fringe projection 3D measurement technology has become the research focus in the field of 3D measurement due to its low cost, high precision, non-contact, and other advantages. It has been widely used in many fields, such as industrial inspection, 3D printing, face recognition, and medical imaging. Knowing the world and transforming the world provide great convenience. In recent years, the rapid development of the digital processing technology has promoted the development of digital projection structured light technology. With the continuous advancement of technology and the substantial increase in computing power, how to use these technological developments to achieve an accurate description of the three-dimensional shape of objects has become a computer research hotspot in the field of visual inspection, but the non-linear effects introduced by commercial projectors interfere with the sine of the fringe when projecting the fringe pattern and affect the experimental results. The study found that the defocusing binary coding technology can eliminate the non-linear error of the projector and avoid various error compensation operations. The method does not need to perform non-linear correction, and the projected binary image can increase the projection speed of the projector and achieve high-precision and high-speed measurement. But the binary jitter fringe after defocusing is not completely close to the standard sine fringe, and there will be a certain deviation in the measurement process.
One-dimensional modulation technologies, such as binary square wave defocusing technology and optimized pulse width modulation technology, can effectively solve the problem of short-term measurement accuracy of fringe periods. Due to the insufficient use of the two-dimensional information of the image, the problem of measurement error still exists when the fringe period increases. The dithering technology effectively utilizes the two-dimensional information of the pattern and can produce high-quality binary fringes after defocusing projection, which greatly improves the experimental effect of defocused structured light three-dimensional measurement in processing long-period fringes, but short-period measurement still exists error. The dither optimization technology minimizes the grayscale difference between the binary fringe and the ideal sinusoidal fringe, and it can improve the sine value of the fringe with different periods. The method we propose can obtain high-quality defocused binary fringes and effectively improve the experimental results of the quality of the fringes with different periods.
This paper proposes an optimization method based on an improved binary ant colony algorithm, which combines the advantages of genetic algorithm and binary ant colony algorithm. Through optimization in the phase domain, the quality of the binary fringe at different defocus degrees is improved, and the phase error is reduced. At last, the measurement accuracy is improved effectively. The simulation and experimental results show that the method proposed in this paper can deal with the measurement under different defocus degrees and is robust.
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Figure 1.
Path selection of binary ant colony algorithm
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Figure 2.
Flowchart of the propose method
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Figure 3.
Binary patterns generated by two methods and patterns after Gaussian filtering
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Figure 4.
Comparison of the Floyd-Steinberg dithering method and the proposed method.
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Figure 5.
The intensity difference and phase RMS error of the two methods between different fringe periods and different sizes of Gaussian filtering.
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Figure 6.
Structure diagram
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Figure 7.
Experimental results of comparing the two methods under amounts of defocusing.
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Figure 8.
The deformed stripe patterns of two methods.
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Figure 9.
Reconstruction of the two methods in mildly, moderate, and severe defocus conditions.
