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Zhang YX, Pu MB, Jin JJ, Lu XJ, Guo YH et al. Crosstalk-free achromatic full Stokes imaging polarimetry metasurface enabled by polarization-dependent phase optimization. Opto-Electron Adv 5, 220058 (2022). doi: 10.29026/oea.2022.220058
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Crosstalk-free achromatic full Stokes imaging polarimetry metasurface enabled by polarization-dependent phase optimization
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Abstract
Imaging polarimetry is one of the most widely used analytical technologies for object detection and analysis. To date, most metasurface-based polarimetry techniques are severely limited by narrow operating bandwidths and inevitable crosstalk, leading to detrimental effects on imaging quality and measurement accuracy. Here, we propose a crosstalk-free broadband achromatic full Stokes imaging polarimeter consisting of polarization-sensitive dielectric metalenses, implemented by the principle of polarization-dependent phase optimization. Compared with the single-polarization optimization method, the average crosstalk has been reduced over three times under incident light with arbitrary polarization ranging from 9 μm to 12 μm, which guarantees the measurement of the polarization state more precisely. The experimental results indicate that the designed polarization-sensitive metalenses can effectively eliminate the chromatic aberration with polarization selectivity and negligible crosstalk. The measured average relative errors are 7.08%, 8.62%, 7.15%, and 7.59% at 9.3, 9.6, 10.3, and 10.6 μm, respectively. Simultaneously, the broadband full polarization imaging capability of the device is also verified. This work is expected to have potential applications in wavefront detection, remote sensing, light-field imaging, and so forth.-
Keywords:
- metasurface /
- broadband achromatic /
- crosstalk-free /
- full polarization /
- imaging polarimetry
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References
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Zhang YX, Pu MB, Jin JJ, Lu XJ, Guo YH et al. Crosstalk-free achromatic full Stokes imaging polarimetry metasurface enabled by polarization-dependent phase optimization. Opto-Electron Adv 5, 220058 (2022). doi: 10.29026/oea.2022.220058
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Figure 1.
The schematic of the continuous broadband achromatic imaging polarimeter. The device is composed of 2×3 sub-arrays, each of which can be regarded as an achromatic focusing lens under a specific polarization basis. The focal spots remain at the same plane under different incident lights in 9-12 μm. The schematic in the white frame on the right shows the principle of polarization-dependent phase optimization.
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Figure 2.
Optical responses of the unit cells. (a) Schematic illustration of the subwavelength structures. (b) Phase response of the database to X-polarization at discrete sampling wavelengths. (c) The amplitude and phase profiles of the unit cells (l1, w1, l2, w2, l3, w3) are marked with white pentagrams in Fig. 2(b). The phase profiles have approximately linear relations with wavelength. The inset is the magnetic energy density profile for the unit cell with l1 and w1 at wavelengths 9, 9.5, 10, 10.5, 11, 11.5, and 12 μm. The black line is the outline of the unit cell. The magnetic energy is strongly concentrated in the dielectric nanopillar.
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Figure 3.
Simulation results of X- and Y-polarization-sensitive metalenses designed with (a) polarization-dependent optimization method versus (b) conventional design method for X-polarized incident light. The upper diagram shows the intensity distribution in the x-z plane, and the white dashed line is the position of the focal plane. The middle figure is the focal plane intensity profile. The lower part is the normalized intensity profile along the white line.
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Figure 4.
Characterization of the polarimeter. (a) Schematic diagram of the process of fabricating polarimeter. (b) Local SEM image of the polarimeter. The inset is an oblique view of the part of the polarimeter, revealing the high aspect ratio of nanopillars. (c) The optical setup for polarimetry. Optical elements: linear polarizer (LP), quarter-wave plate (QWP), metasurface (MS).
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Figure 5.
Optical Performances of the broadband achromatic metalenses for linear polarization. (a) The X and Y polarization-sensitive metalenses measured intensity distributions in the x-z plane at sampled incident wavelengths for 9.3, 9.6, 10.3, and 10.6 μm under X polarized incidence. The white dashed lines are the position of the focal plane. (b) The measured focal plane intensity distributions. (c) The extracted focal lengths of the simulation and experiment are a function of wavelength, and all focal lengths are around the target 1 cm. (d) The measured and simulated FWHMs of the focal spots versus the sampled wavelengths. (e) The measured and simulated focusing efficiencies. The blue solids represent the corresponding theoretical results at 9, 9.3, 9.5, 9.6, 10, 10.3, 10.5, 10.6, 11, 11.5, and 12 μm, and the red solids represent the experimental results at 9.3, 9.6, 10.3, and 10.6 μm. Exp.: experiment. Sim.: simulation.
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Figure 6.
Characterization results of the polarimeter. Measured intensity distributions at the focal plane and normalized Stokes parameters for different incident polarizations (shown with black arrows) with wavelengths of (a) 9.3 μm, (b) 9.6 μm, (c) 10.3 μm, and (d) 10.6 μm. The theoretically normalized Stokes parameters for X, Y, A, B, L, R, 30º linear polarization and elliptically polarization (the ratio of the major axis to the minor axis is
$ \sqrt{3} $ -
Figure 7.
Polarization imaging. (a) Polarization imaging of the polarization mask. (b) Theoretical results (top) and experimental results (bottom) of Stokes parameters S0–S3 corresponding to (a). (c) Polarization imaging of the resolution target. (d) Theoretical results (top) and experimental results (bottom) of Stokes parameters S0–S3 corresponding to (c).
